Registration
Dear colleagues,
We would like to inform you that registration for our workshop is unfortunately already closed.
Thank you for your interest! We hope to welcome you at future events.
We are delighted to be organising the 21st workshop after the first one in 2003. As in previous years, our partners and customers will be sharing their insights and experiences in presentations at the heart of the event.
You are cordially invited to attend the workshop, where you will have the opportunity to engage in a mutually beneficial exchange and enjoy the inspiring atmosphere of this one-day event.
The participation fee of € 280 includes lunch and dinner. An online link will be made available to all registrants, so that the presentations can be followed in case attendance at the workshop is not possible.
Please register by using the „Registration“ button on this website.
I am looking forward to meeting you in person at the workshop.
Sincerely,
Julian Hartbaum
Dear colleagues,
We would like to inform you that registration for our workshop is unfortunately already closed.
Thank you for your interest! We hope to welcome you at future events.
09:30 (00:05)
Welcome
09:50 (00:20)
The next step in Moore’s Law: High NA EUV is here
10:10 (00:20)
High-NA EUV – breakthrough in resolution and precision
10:30 (00:20)
IMS GmbH - Strengthening the IMS industry business over the next years
11:20 (00:20)
Mastering the master
11:40 (00:20)
Synchronization of Process and Material to Achieve Best Results in Nanoimprinting Lithography
12:00 (00:20)
Nanoimprint lithography for the fabrication of multifunctional nanoparticles for biomedical applications
12:20 (00:20)
Multi-Beam Mask Writers in the high-NA EUV era
14:50 (00:20)
How can Variable Shaped Beam lithography be tuned for photonic and optics applications?
15:10 (00:20)
Innovative Photopolymers Advancing Micro- and Nano Patterning for Photonic Applications
15:30 (00:20)
Advancements in nano-photonics: From PICs to waveguides to spectrometer gratings
16:20 (00:20)
Quantum sensors for native human machine interfaces
16:40 (00:20)
2.5D grayscale and intra level mix and match lithography by electron beam and i-line stepper lithography processes
17:00 (00:20)
Multi Modal Optical Metrology for High Resolution Refractive Index and Film Thickness Measurements